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PS-HM-8425 Hall measurement package for the CRX-VF probe station

CRX-VF with PS-HM-8425 Hall measurement package

Easily add Hall measurement capabilities to your probe station

A complete solution for enabling Hall measurements in a CRX-VF probe station
Supports a range of DC Hall measurements on wafer-scale materials and structures as a function of temperature and field
Includes all the instrumentation and software for facilitating Hall measurements
Supports DC fields to 2 T and resistances from 0.5 mΩ to 100 GΩ
Intuitive software provides easy system operation, data acquisition, and analysis
Supports exporting of data for multi-carrier analysis

Sample measurement options for PS-HM-8425

84-HBM Hall bar measurement: 6 total probe arms are required for Hall bar measurement; option provides two additional arms (each is MMS-09 with cabling ZN50C-T and probe mount ZN50-55i), the software is already enabled, factory- or field-installed

84031 High-resistance measurement: provides resistance measurement range from 10 kΩ up to 100 GΩ; includes KI6514 electrometer and other hardware; factory-installed

84031-FI High-resistance measurement, same as 84031, but field-installed

84032P Gate bias voltage measurement: includes KI6487 voltage source and SH-2.00-T-VF triaxial 51 mm sample holder, factory-installed

84032P-FI Gate bias voltage measurement, same as 84032P, but field-installed

750QMSA QMSA® software option

The power of the Hall measurement software

The solution adds several instruments to your CRX-VF console, including a switch matrix, current source, and voltmeter. However, the real power is provided in the 8400 Series HMS software, which is on a PC that ships with the package.

This next-generation Hall measurement software enables easy system operation, provides a suite of data acquisition and analysis tools, and allows you to control field, sample temperature, and sample excitation while running Hall measurements in an automated fashion.*

resistivity results

Example of an HMS measurement results screen

Notable software features:

Supports van der Pauw and Hall bar measurements, and measuring samples with gated Hall bars to account for gate bias—ideal for device-level material measurement.
Create a variable temperature Hall measurement with just three clicks of a mouse.
Start and end a measurement at your convenience, as well as set up time loops to repeat measurements according to a schedule.
Easily insert a resistance measurement into a Hall measurement sequence.
Use quick commands to “Go to Temperature,” “Go to Field,” “Go to GBV” (gate bias voltage), and “Wait,” to let the system pause and settle before continuing.
Perform resistance measurements at the start of an experiment—very useful when you need to do a quick, initial sample check to determine usable current, for instance.
Supports data export for multi-carrier analysis.

*Manual adjustment of the probe station’s heat switch is required at several temperature points.