Lake Shore spotlighting new material characterization solutions at APS exhibit
02/27/2018
Visit Booth 301 to see new current and voltage source and learn about cryogenic thermometry products
APS March 2018

Lake Shore Cryotronics will showcase their latest in material characterization solutions, including a new precision I/V current and voltage source, and cryogenic temperature measurement and control products at next week’s APS March Meeting & Exhibit in Los Angeles.

For attendees interested in material characterization, Lake Shore will be answering questions about their:

  • 155 precision I/V source, the first product in the company’s new MeasureReady™ line of “built for science, designed for people” characterization products. Operating as either a current or voltage source and providing DC and AC output, the source offers premium performance to users requiring a precise, low-noise supply of current or voltage in the lab. Exceptional DC noise levels are achieved without external filtering while maintaining bandwidth up to 100 kHz.
  • Cryogenic probe stations for on-wafer probing of material samples at variable temperatures and in fields to more than 2 T. These stations can be specified with probes for DC, RF, and microwave measurements as well as a THz-frequency probe arm for precise probing of millimeter wave devices at 75 to 110 GHz or 140 to 220 GHz frequencies. (The affordable TTPX model will be on display in the Lake Shore booth.)
  • Award-winning 8600 Series VSMs. These electromagnet-based VSMs raise the bar for magnetometer performance and convenience, combining high sensitivity (<15 nemu), rapid measurement speed (10 ms/pt), and simple operation in a system that enables researchers to perform more science in less time.
  • 8400 Series Hall effect measurement systems with an AC field Hall option for characterizing materials with very low mobilities, including many semiconductor and electronic materials, down to 0.001 cm2/V s.

In related material characterization news, two Lake Shore scientists will be presenting at the APS March Meeting: Dr. Jeffrey Lindemuth on “Fast Hall™: A High Speed Hall Measurement for Material Characterization,” (during Tuesday’s H06 session), and Dr. David Daughton on “Transient Hall Effect Characterization of Persistent Photo-Generated Carriers in GaN/AlGaN Heterostructures” (Wednesday’s K11 session). Dr. Daughton will be reporting on research performed in collaboration with Dr. Lindemuth and Dr. BoKuai Lai, Lake Shore Development Engineer.

Lake Shore will also be on-hand in the APS exhibit hall to discuss cryogenic thermometry products, including: