Complete your probe station system
Integrate the M81-SSM and SMU-10 source measure modules for a complete I-V characterization solution
Source + measure + lock-in
Optional add-on
The M81-SSM synchronous source measure system is optimized for cryogenic material and device characterization. The latest addition to the system is the M81-SMU-10 module, which integrates the functions of four separate source and measure modules into one compact unit. This all-in-one design consolidates all source and measure signals through a single set of triaxial connections, which is ideal for probe station applications.
When probing samples at various temperatures, the ability to assign specific voltage or current, DC, AC, and lock-in detection per prober arm simplifies and accelerates I-V characterization. With up to three SMUs per M81 instrument, all DC to 100 kHz signals are programmable via software or front panel. This setup enhances signal configurability, increasing test throughput and data collection efficiency.
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Minimize thermal impact by using SMU-10 modules with a probe station. In this example, the orange wire is the source, the light blue wire is the drain, the dark blue wire is the gate, and the black wire is the ground.
Three-terminal FET DC transfer curve
SMU-10 characterization of FET spanning 10+ decades of current