NEW — FIRST OF ITS KIND AC + DC + LOCK-IN SMU
A better lock-in amplifier
A lock-in amplifier with all the features you need to accelerate your research—the M81-SSM with the SMU-10 module offers the usual lock-in capabilities plus sourcing and measuring in one easy-to-use package. Set up quickly, avoid setup errors, and be confident signals are noise-free, even on emerging nanomaterials.
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Components of the M81-SSM

- Connect up to three source modules and up to three measure modules
- Exchange modules and adapt the configuration for each measurement
- All modules are capable of measuring with DC and AC to 100 kHz
- All modules are optimized for the highest precision with common amplitude and frequency references
Flexible measurement capabilities

The M81-SSM provides DC and AC stimulus and measurement capabilities for characterizing materials and devices in cryogenic, room temperature, and high-temperature environments.
Choose a combination of differential current source and voltage measurement modules for low-resistance applications requiring a precise stimulus current and the noise-cancellation benefits of balanced (floating) sample connections. Or mix and match with
additional voltage source and current measurement modules for complex higher-impedance or gate-biasing applications where precise voltage control and sweeping test regimes are required.
Unlike a narrow-bandwidth DC system, these modules operate from very low frequencies to 100 kHz. You can select a measurement bandwidth to avoid 1/f noise and other bands where test environment noise is highest.
The system’s MeasureSync™ technology samples all sourcing and measurement channels at precisely the same time, enabling multiple DUTs to be tested under identical conditions so you can obtain consistent data.
Lake Shore optional MeasureLINK™ software can provide configurable measurement scripts and loops to support a variety of applications. It facilitates easy integration with Lake Shore cryogenic probe stations as well as third-party systems.
These combined capabilities make the M81‑SSM a superior solution for characterizing several test structures, including nanostructures, single- and multilayer atomic structures, MEMs, quantum structures, organic semiconductors, and superconducting materials.






