icon
Sign In
Celebrating 50years
divider line
 

John Krause

Director of Metrology

I have been involved with the operation and evolution of Lake Shore’s temperature calibration facility since 1981. Though customer requirements and technological expectations have changed through the years, we have been able to consistently provide reliable calibrations traceable to international standards that meet the needs of almost everyone in the cryogenic field. We offer capabilities second to none over the temperature range that our sensors operate.

 

John Krause

Dr. John Krause is Director of Metrology and Senior Scientist at Lake Shore. He received his BA in Math and Physics from St. Olaf College and his PhD in Solid-State Physics from Iowa State University. Prior to joining Lake Shore, he held a post-doctoral research position at the University of Delaware and then worked in the Physical Vapor Deposition Group of Battelle Memorial Institute in Columbus, Ohio.

Dr. Krause started at Lake Shore in 1981, working first in temperature sensor research, development, and calibration. As the company expanded into magnetics in the late 1980s, he led the technical development of Lake Shore’s first magnetic measurement system: a superconducting magnet based AC susceptometer/DC magnetometer. The success of this product lead to the addition of VSMs and electromagnets as well as the development of Lake Shore’s first Hall measurement system. Currently, Dr. Krause is the Director of Metrology, where he has responsibility for all of Lake Shore’s calibration processes. Dr. Krause holds four patents, has received an I•R100 Award, and has published a number of articles in industry and scientific journals.

Publications

A New Capsule Platinum Resistance Thermometer for Cryogenic Use
S. S. Courts and J. K. Krause, Temperature: Its Measurement and Control in Science and Industry, Vol. 8, Christopher W. Meyer, ed., AIP Publishing, Melville (2013), AIP Proceedings 1552, pp. 168 – 173, 2013.

Finite Sample Size Effects on the Calibration of Vibrating Sample Magnetometer
J. Lindemuth, J. Krause, and B. Dodrill, Magnetics IEEE Transactions on 37 (4), 2752 – 2754.

Effects of Room Temperature Aging on Two Cryogenic Temperature Sensor Models Used in Aerospace Applications
S. Scott Courts and John Krause, Advances in Cryogenic Engineering, Vol. 57B, J. G. Weisend II, ed., American Institute of Physics Conference Proceedings 1434, New York (2012), pp. 1329 – 1336, 2012.

Reliability and Stability of Three Cryogenic Temperature Sensor Models Subjected to Accelerated Thermal Cycling
S. Scott Courts and John Krause, Advances in Cryogenic Engineering, Vol. 57A, J. G. Weisend II, ed., American Institute of Physics Conference Proceedings 1434, New York (2012), pp. 515 – 522, 2012.

Diode Temperature Sensor Curve Estimation and Interchangeability for Non-Standard Excitation Currents
S. Courts, C. J. Yeager, and J. K. Krause, Advances in Cryogenic Engineering, Vol. 51B, J. G. Weisend II, ed., American Institute of Physics, Melville (2006), p. 1235, 2006.

Finite Sample Size Effects on the Calibration of Vibrating Sample Magnetometer
J. R. Lindemuth, J. K. Krause, and B. C. Dodrill, IEEE Transactions on Magnetics 37, 2752, 2001.

AC Magnetic Susceptibility Measurements of Organic Superconducting Materials
B. C. Dodrill and J. K. Krause, Proceedings of the Symposium on Advances in Chemistry and Properties of Novel Low-Dimensional and Conducting or Superconducting Solids, Molecular Crystals and Liquid Crystals, Gordon & Breach, 1995.

Extraction Magnetometry in an AC Susceptometer
J.K. Krause, IEEE Transactions on Magnetics 28, 3066, 1992.

Performance Characteristics of Silicon Diode Cryogenic Temperature Sensors
B. C. Dodrill, J. K. Krause, P. R. Swinehart, and V. Wang, in Applications of Cryogenic Technology, Vol. 10, J. P. Kelley, ed., Plenum Press, New York (1991), p. 85, 1991.

Measurement System Induced Errors in Diode Thermometry
John K. Krause and Brad C. Dodrill, Review of Scientific Instruments 57, 661, 1986.

Reliable Wide-Range Diode Thermometry
John K. Krause and Philip R. Swinehart, Advances in Cryogenic Engineering, Vol. 31, R. W. Fast, ed., Plenum Press, New York (1986), p. 1247, 1986.

The Low Temperature Specific Heat of the Metallic Glasses (FexNi80-x)B20
David G. Onn, Amy Sundermier, and J. K. Krause, Journal of Applied Physics 52, 1802, 1981.

Direct Measurements of the Constant Volume Heat Capacity of Solid Parahydrogen from 22.79 to 16.19 cm3/mole and the Resulting Equation of State
J. K. Krause and C. A. Swenson, Physical Review B 21, 2533, 1980.

Low Temperature Specific Heat of the Metallic Glasses FexNi80-xP14B6 and (FeyNi100-y)79P13B8 for the Spin Glass and Spin Cluster Glass Regimes
J. K. Krause and T. C. Long, Physical Review B 21, 2886, 1980.

Metalloid Effects in the Low Temperature Specific Heat of Transition Metal Metallic Glasses
J. K. Krause, T. C. Long, David G. Onn, and F. E. Luborsky, Journal of Applied Physics 50, 7665, 1979.

Thermally-Induced Ortho-Para Conversion Anomaly in Solid Hydrogen Under Pressure
John K. Krause and C. A. Swenson, Solid State Communications 31, 833, 1979.

The Melting Curve of Helium from 4 to 25 K
J. K. Krause and C. A. Swenson, Cryogenics, 413, July 1976.

Understanding Magnetic Measurement Techniques
John K. Krause and Jeffrey R. Bergen, Superconductor Industry 3, 23, Winter, 1990.

Temperature Sensors for Cryogenic Applications
John K. Krause, Philip R. Swinehart, and Jeffrey R. Bergen, Sensors, 18, February, 1988.

Demystifying Cryogenic Temperature Sensors
John K. Krause and Philip R. Swinehart, Photonics Spectra, 61, August, 1985.