Lake Shore Cryotronics will be at next week’s CEC/ICMC (Cryogenic Engineering Conference/International Cryogenic Materials Conference) in Hawaii to discuss their latest in cryogenic thermometry and cryostat solutions.

Lake Shore’s Scott Courts and Dan Logan will be in Booth 320 to answer questions about the company’s:

• ULT Rox™ RTD sensors for operation below 10 mK; when paired with the Model 372 AC resistance bridge, they enable simplified control in any application below 50 mK, with some calibration configurations providing the ability to achieve temperature readings down to 5 mK (the Model 372 will be on display in the booth)
• Industry-leading Cernox^® RTD sensors, which provide fast thermal response time and excellent stability over a wide temperature range, even when exposed to magnetic fields or ionizing radiation
• Model 336 controller, featuring eight sensor inputs and four independent control outputs, and the ability to control down to 300 mK when using appropriate sensors
• Model 350 controller, with eight sensor inputs and four independent control outputs, and supporting measurements as low as 100 mK with the appropriate sensors
• Monitoring instrumentation, including the 12-channel Model 224 monitor and the 240 Series sensor input modules for sensor monitoring in large-scale distributed applications employing PLC-based control
• Environment by Janis cryostats and other solutions for cryogenic cooling, including the recirculating gas cooler (RGC) system, which offers the flexibility and convenience of a continuous-flow cryostat without a constant need for liquid helium (on display will be the ST-500 cryostat, which is often used for sample cooling with the RGC)

For attendees interested in low-temperature characterization platforms, Lake Shore will also be available to discuss:

• The new, all-in-one CryoComplete™ system for 77 K to 500 K material and device research, containing a MeasureReady™ M81-SSM synchronous source measure system, LN₂ cryostat, temperature controller, and PC with MeasureLINK™ test control and data charting software
• Cryogenic probe stations for performing on-wafer DC, RF, or high-frequency measurements at temperatures as low 1.6 K and in fields to as high as 5 T under vacuum
• Hall effect measurement systems and vibrating sample magnetometers with low-temperature options

In addition, prior to the start of the exhibition, Courts will present a CSA short course on “Practical Cryogenic Thermometry and Instrumentation” on Sunday from 1 to 5 p.m. To register, visit the CSA short course registration page.