Lake Shore Cryotronics will be at next week’s International Microwave Symposium (IMS) in Denver to discuss cryogenic probe stations and high-performance cryostats optimized for high-frequency device research.

Cryogenic probe stations benefit early-stage research requiring fundamental I-V, C-V, and other electrical measurements of test structures, including those for MMIC, LNA, or MEMS designs. In these applications, there is often a need for non-destructive RF/microwave measurements as a function of low temperature as well as magnetic field within a controlled environment. Lake Shore probe stations provide this control, with temperatures as low as 1.6 K, and can be configured for RF probing up to 1 GHz and/or GSG RF/microwave probing up to 40 or 67 GHz.

Various configurations are available, including models for cryogen-free or liquid cryogen operation, and an affordable tabletop model for probing devices on full and partial wafers up to 51 mm (2 in) in diameter. This Model TTPX will be on display in Lake Shore’s booth (#7038) at IMS.

In addition, Lake Shore representatives will be discussing high-performance environment by Janis cryostats for microwave research. These cryostats are available with RF cabling and feedthroughs, enabling easy integration into high-frequency measurement applications.

Also at IMS, Lake Shore Application Scientist David Daughton will take part in a Tuesday afternoon industry workshop (IWTU5) on the topic of mixed-mode/differential S-parameter characterization at cryogenic temperatures for quantum computing applications. Presented in conjunction with Suren Singh and Nizar Messaoudi of Keysight Technologies and held in Room 403/404 of the Colorado Convention Center, the 1:30 p.m. workshop will cover the instrumentation, probes, calibrations, and environmental consideration for such wafer-level characterization of devices in presence of magnetic fields.

Later the same day, in the show floor’s MicroApps theatre, Daughton and Lake Shore CTO Scott Yano will join Andy Owen of Keysight Technologies for a 2:30 p.m. seminar discussing the “Challenges of Automatic Fixture Removal (AFR) in Cryogenic Environments.” This topic is relevant to researchers interested in using a Keysight Technologies PNA with the AFR option in conjunction with a Lake Shore cryogenic probe station to measure S-parameters of test structures over a wide temperature range — measurements that are valuable to researchers developing next-generation millimeter-wave detector, radio astronomy, and other technologies.