Lake Shore Cryotronics will showcase cryogenic probe stations for high-frequency device measurement during the June 6 – 8 IEEE MTT International Microwave Symposium (IMS) in Honolulu.

Cryogenic probe stations benefit early-stage research requiring fundamental IV, CV, and other electrical measurements of test structures, including those for new MMIC, LNA, MEMS, or superconducting circuit designs. In these applications, there is often a need for non-destructive RF/microwave measurements as a function of low temperature, as well as magnetic field, in a controlled environment. Lake Shore probe stations provide this level of control and can be configured for RF probing up to 1 GHz and/or GSG RF/microwave probing up to 40 or 67 GHz at very low temperature.

Various probe station configurations are available, including models for cryogen-free or liquid cryogen operation, and an affordable tabletop model for probing devices on full and partial wafers up to 51 mm (2 in) in diameter. This version, the Model TTPX, will be set up in Lake Shore’s booth at IMS.

Also on display will be Lake Shore’s latest high-frequency probing innovation: a cryogenic THz probe arm option. This contact-probing solution, designed for on-wafer probing of millimeter wave (MMW) devices at 75 to 110 GHz and 140 to 220 GHz frequencies, enables calibrated S-parameter and other high-frequency measurements to be performed at cryogenic temperatures. These measurements offer specific value to researchers developing next-generation technologies, such as new THz detector, radio astronomy, and 5G wireless components.

For more information about these products, as well as Lake Shore’s turnkey THz-frequency spectroscopic system for characterizing materials over a range of temperatures and field strengths, visit IMS Booth 1732.