Lake Shore Cryotronics will exhibit its systems for advanced nanoscale device and material characterization at the TechConnect World Nanotech Conference and Expo, June 15 – 16 in Washington, D.C.

Lake Shore will discuss its state-of-the-art vibrating sample magnetometers and alternating gradient magnetometers (VSM/AGMs). Used in the study of nanoscale magnetic materials, such as nanomagnetic composites, dots, wires, and arrays, Lake Shore VSM/AGMs offer high sensitivity, accuracy, and speed, and are ideal for performing first-order-reversal-curve (FORC) measurements. These measurements are crucial in understanding the magnetic properties of materials and in determining the distribution of switching and interaction fields in nanoscale magnetic materials.

At the conference, Brad Dodrill, Lake Shore Senior Scientist and VP of Sales, will be presenting a poster on “First Order Reverse Curve Analysis of Nano-Composite Permanent Magnets,” based on a paper he authored. In it, he discusses the FORC measurement and analysis technique and its uses in distinguishing between magnetic phases in multi-phase nano-composite magnetic materials. Lake Shore MicroMag™ VSM/AGMs are arguably the standard for FORC measurements because of their measurement speed.

In addition to VSM/AGMs suited for FORC analysis, Lake Shore offers the 7400 Series VSM, designed for nanoscale material study over a wide temperature range (4.2 K to 1,273 K) and applied magnetic fields (3 T).

Also at Nanotech, Lake Shore will be providing information on its:

• Cryogenic probe stations that support magneto-transport, electrical and electro-optical, DC, RF, and microwave (to 67 GHz) and THz (to >100 GHz) non-destructive probing of nanoscale electronic and magnetic materials.
• Terahertz (THz) materials characterization system for measuring spectroscopic responses of magnetic and electronic materials across a range of frequencies, temperatures, and field strengths.

For more information, visit Nanotech Booth 509.