Lake Shore will be exhibiting October 7 – 9 during the 44th European Microwave Week (EuMW) conference in Rome, Italy, where it will discuss its platforms for the study of devices and materials using high-frequency measurements.

 

Platforms include Lake Shore’s industry-leading probe stations for non-destructive probing of materials and test devices, whether for the study of electrical, magneto-transport, DC, RF, or microwave properties. They are particularly useful for carbon-based nanotube (CNT), graphene, MEMS, gallium-nitride (GaN), silicon-germanium (SiGe), superconducting device, and organic semiconductor research.

 

Lake Shore probe stations are specifically designed for on-wafer probing and measurement of device samples as a function of temperature and field. Interrogating samples at cryogenic temperatures and in high magnetic fields can reveal certain mechanisms of novel materials, particularly in semiconductor and nanoscale device research. Low-temperature operation is becoming increasingly important in the development of new electronic devices, including high-speed SiGe-based transistors.

 

Lake Shore offers cryogen-free CCR probe stations and liquid cryogen models, as well as a number of probes, sample holders, and other options to enable the configuring of a station for a specific application. These include ground-signal-ground (GSG) style probes for 40- or 67-GHz frequency ranges and designed for optimum microwave measurement performance at cryogenic temperatures.

 

In addition, Lake Shore is currently working with several companies and university researchers to develop terahertz-frequency, on-wafer contact probing for cryogenic applications. The goal of this is to enable high-speed device probing and performance measurements at variable temperatures and fields for next-generation electronics R&D. To learn more about this industry/university collaboration and to see a prototype of Lake Shore’s cryogenic THz probe arm assembly, visit EuMW Stand 206.

 

Also at EuMW, Lake Shore will be discussing its turnkey Model 8501 THz system for non-contact characterization of materials at variable temperature and in high field. This complete platform includes intuitive management and analysis software and features an integrated high-field cryostat and uniquely designed continuous wave (CW) THz emitter and detector components. Supporting the ability to measure at 200 GHz to 1.5 THz frequencies with spectral resolution of better than 500 MHz, the system’s CW-THz spectroscopy can reveal properties that other techniques miss because many phenomena have been found to align with these frequencies.

 

For more information, visit EuMW Stand 206.