Lake Shore Cryotronics will be at next week’s 56th Electronic Materials Conference (EMC) in Santa Barbara, CA, where it will be spotlighting its non-contact Model 8501 THz system for material characterization.

The EMC conference, which will occur June 25–27 on the University of California-Santa Barbara campus, is the premier gathering of scientists involved in characterizing electronic materials. Because THz spectroscopy can be very helpful to the study of a number of electronic materials, Lake Shore will be specifically discussing the unique advantages of the award-winning THz system for this segment of the material research community.

THz wavelengths match the feature sizes of development-grade materials and couple very strongly to the free-carrier motion of a number of these materials. Lake Shore’s system is unique because, unlike existing time-domain (TDS) spectroscopy systems, the Model 8501 uses a continuous wave (CW) spectrometer for higher spectral resolution (better than 500 MHz). Spectral profiles generated by the system can reveal interesting phenomena not visible with conventional characterization techniques.

Also, because the fully integrated system includes a high-field cryostat and superconducting magnet, spectroscopic responses of material properties can be measured across a range of temperatures and field strengths. These capabilities benefit researchers having to study materials at low temperatures or characterize bulk materials at an early stage, when high magnetic fields (up to 9 T) may be required.

The Model 8501 system enables amplitude and phase detection from 0.2 to 1.5 THz and supports measurements to determine dielectric constant, optical conductivity, and carrier scattering of a number of materials, including 2D, superconducting, complex oxide epilayer, and functional organic materials, as well as thin-film semiconductor materials.

For EMC attendees interested in thin-film semiconductor characterization, Lake Shore’s Dr. David Daughton will be giving a talk on “Variable-Temperature Terahertz Conductivity of Gallium-Doped ZnO Thin Films,” to be held 11 a.m. Friday, June 27, during the KK: THz and IR Metamaterials and Surfaces session. His presentation will focus on the study of dynamic conductivity of ZnO materials when combining temperature-dependent Hall effect measurements with variable-temperature CW-THz spectroscopy.

Also at EMC, Lake Shore will provide information on its:

• Cryogenic probe stations for non-destructive probing of device materials in temperature and magnetic environments, whether for the study of electrical, magneto-transport, DC, RF, or microwave properties in devices containing CNT, MEMS, GaN, SiGe, or other electronic materials.
  
• Hall effect measurement systems, including the new Model 8407, which has a 7-inch magnet and, like the existing Model 8404 with a 4-inch magnet, can be ordered with AC field Hall option for exploring properties of low-mobility electronic materials (down to 0.001 cm²/V s). The larger magnet is also ideal for analyzing materials at the low end of the mobility range of DC measurements.