Lake Shore Cryotronics will be exhibiting at the June 3–5 IEEE MTT International Microwave Symposium (IMS), in Tampa Bay, FL, where they will discuss platforms that enable the study of devices and materials using high-frequency measurements.

Platforms include Lake Shore’s industry-leading probe stations  for non-destructive probing of materials and test devices, whether for the study of electrical, magneto-transport, DC, RF, or microwave properties. They are useful for carbon-based nanotube (CNT), graphene, MEMS, gallium-nitride (GaN), silicon-germanium (SiGe), superconducting device, and organic semiconductor research.

Lake Shore probe stations are specifically designed for on-wafer probing and measurement of device samples as a function of temperature and field. Interrogating samples at cryogenic temperatures and in high magnetic fields can reveal certain mechanisms of novel materials, particularly in semiconductor and nanoscale device research. Low-temperature operation is becoming increasingly important in the development of new electronic devices, including high-speed SiGe-based transistors.

Lake Shore offers four cryogen-free CCR probe stations and six liquid cryogen models, as well as a wide selection of probes, sample holders, and other options to enable users to configure a station for a specific application. Among these are ground-signal-ground (GSG) style probes, available for 40- or 67-GHz frequency ranges and designed to ensure optimal microwave measurement performance at cryogenic temperatures.

In addition, Lake Shore is currently working with several companies and university researchers towards the development of terahertz-frequency, on-wafer contact probing for cryogenic applications. The goal of this is to enable high-speed device probing and performance measurements at variable temperatures and fields for next-generation electronics R&D. To learn more about this industry/university collaboration, please visit Lake Shore IMS Booth 1352.

Also at IMS, Lake Shore will also be discussing its new turnkey Model 8501 THz system for non-contact characterization of materials at variable temperature and in high field. This complete platform features an integrated high-field cryostat and specially designed continuous wave (CW) THz emitter and detector components, supporting the ability to measure at higher frequencies (200 GHz to 1.5 THz). CW THz spectroscopy can reveal properties that other techniques miss because many phenomena have been found to align with these frequencies, and it offers particular potential for characterizing dielectric materials for high-frequency and waveguiding applications.