Integrated THz System for Material Characterization
New frontiers in materials research
Our new THz technology system will provide a fully integrated solution for exploring electronic, magnetic, and chemical properties of materials for tomorrow’s technologies.
Advancing THz Research
Lake Shore's prototype materials characterization system uses non-destructive, non-contact THz energy to measure important phenomena in novel electronic and magnetic materials being explored for high-speed computing, storage, imaging and communications applications. The system is in testing at several key research institutions and is expected to be available in early 2014.
THz spectroscopy—intriguing possibilities
THz characterization is of particular interest because a number of important electronic and magnetic phenomena align with these frequencies. These include the energy levels of novel phenomena as well as matching the feature sizes of development-grade electronic materials. THz is also a contactless measurement.
Interesting physical phenomena occur on THz energy scales
- Carrier scattering time in semiconductors, important to development of high speed electronics
- Vibrational resonances in molecular solids, important to chemical identification and research in organic electronic and magnetic materials
- Antiferromagnetic resonances, important to spin-based computing