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Cryogenic Probe Stations
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| Model |
Magnet field |
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Standard Temperature
range |
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Sample stage rotation |
| Cryogen-Free Cryogenic Probe Stations |
| CRX-EM-HF |
0.6 T horizontal field electromagnet |
4 |
8 K to 400 K |
20 K to 500 K |
— |
25 mm (1 in) diameter |
10-5 torr |
±360° (optional) |
| CRX-VF |
2.25 T vertical field superconducting magnet |
6 |
10 K to 350 K |
10 K to 500 K |
— |
51 mm (2 in) diameter |
10-5 torr standard,
10-7torr optional |
— |
| CRX-4K |
— |
6 |
4.5 K to 350 K |
20 K to 500 K |
— |
51 mm (2 in) diameter |
10-5 torr |
— |
| CRX-6.5K |
— |
6 |
<10 K to 350 K |
20 K to 675 K |
— |
51 mm (2 in) diameter |
10-5 torr |
— |
| Cryogenic Probe Stations |
| FWPX |
— |
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4.5 K to 475 K |
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3.5 K |
102 mm (4 in) diameter |
10-5 torr |
±5° |
| EMPX-HF |
0.55 T horizontal field electromagnet |
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4.5 K to 400 K;
8 K to 400 K with 360° rotation option |
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3.2 K |
25 mm (1 in) diameter |
10-5 torr |
±360° (optional) |
| CPX-HF |
1 T horizontal field superconducting magnet |
4 |
4.2 K to 400 K |
— |
2 K |
25 mm (1 in) diameter |
10-5 torr standard,
10-7 torr optional |
±5° |
| CPX-VF |
2.5 T vertical field superconducting magnet |
6 |
4.2 K to 400 K |
— |
2 K |
51 mm (2 in) diameter |
10-5 torr standard,
10-7 torr optional |
±5° |
| CPX |
— |
6 |
4.2 K to 475 K
10 K to 400 K with load-lock |
20 K to 675 K
Cannot be used with load-lock sample assembly |
Low temp: 2 K
Very low temp: 1.5 K |
51 mm (2 in) diameter
12.7 mm (0.5 in) with load‑lock |
10-5 torr standard,
10-7 torr optional |
±5° |
| TTPX |
— |
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4.2 K to 475 K |
20 K to 675 K |
3.2 K |
51 mm (2 in) diameter |
10-5 torr |
— |
| Download the PDF version |
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| Model CRX-4K Cryogenic Probe Station |  | Features of the Model CRX-4K Probe Station
- Closed cycle refrigerator provides high stability cryogen-free operation from 4.5 K to 350 K
- Optional temperature range from 20 K to 675 K
- Control stability to 10 mK
- Sample exchange cycle time of <3.5 h
- Low vibration design: <1 µm at sample stage (X, Y, and Z axes)
- Measurements from DC to 67 GHz
- Sample holders optimized for low noise, high frequency, or high impedance measurements
- Accommodates up to 51 mm (2 in) diameter wafers
- Configurable with up to six thermally anchored micro-manipulated probe arms
- Probe arms with 3-axis adjustments and ±5° theta planarization
- Cables, shields, and guards minimize electrical noise and thermal radiation losses
- Options and accessories for customization to specific research needs
| | More information on the Model CRX-4K Cryogenic Probe Station |
| | Model CRX-6.5K Cryogenic Probe Station |  | NEW | Features of the Model CRX-6.5K Probe Station
- Closed cycle refrigerator provides high stability cryogen-free operation from <10 K to 350 K
- Optional temperature range from 20 K to 675 K
- Probes thermally anchored to the sample stage cooled to <20 K at base temperature
- Probe arm sensor for monitoring probe temperature
- Control stability to 10 mK
- Low vibration design: <2 µm at sample stage
- Measurements from DC to 67 GHz
- Sample holders optimized for low noise, high frequency, or high impedance measurements
- Accommodates up to 51 mm (2 in) diameter wafers
- Configurable with up to six thermally anchored micro-manipulated probe arms
- Probe arms with 3-axis adjustments and ±5° planarization
| | More information on the Model CRX-6.5K Cryogenic Probe Station |
| | Model CRX-VF Cryogenic Probe Station |  | NEW | Features of the Model CRX-VF Probe Station
- 25 kOe (2.5 T) vertical field superconducting magnet*
- Closed cycle refrigerator provides high stability cryogen-free operation from 10 K to 500 K
- Control stability to 10 mK
- Low vibration design: <1 µm at sample stage (X, Y, and Z axes)
- Measurements from DC to 67 GHz
- Sample holders optimized for low noise, high frequency, or high impedance measurements
- Accommodates up to 51 mm (2 in) diameter wafers
- Configurable with up to six thermally anchored micro-manipulated probe arms
- Probe arms with 3-axis adjustments and ±5° planarization
- Cables, shields, and guards minimize electrical noise and thermal radiation losses
- Options and accessories for customization to specific research needs
| | More information on the Model CRX-VF Cryogenic Probe Station |
| | Model CRX-EM-HF Cryogenic Probe Station |  | NEW | Features of the Model CRX-EM-HF Probe Station
- 6.0 kOe (0.6 T) horizontal (in-plane) field electromagnet
- Closed cycle refrigerator provides high stability cryogen-free operation from 8 K to 400 K
- Control stability to 10 mK
- Sample exchange cycle time of <4.5 h
- Low vibration design: <1 µm at sample stage (X, Y, and Z axes)
- 360° sample stage rotation option
- Measurements from DC to 67 GHz
- Accommodates up to 25 mm (1 in) diameter wafers
- Configurable with up to four thermally anchored micro-manipulated probe arms
- Probe arms with 3-axis adjustments and ±5° planarization
- Cables, shields, and guards minimize electrical noise and thermal radiation losses
- Options and accessories for customization to specific research needs
| | More information on the Model CRX-EM-HF Cryogenic Probe Station |
| | Model FWPX Cryogenic Probe Station |  | Features of the Model FWPX Probe Station
- High stability operation from 3.5 K to 475 K
- Measurements from DC to 67 GHz
- Accommodates up to 102 mm (4 in) diameter wafers
- Configurable with up to six thermally anchored micro-manipulated probe arms
- Probe arms with 3-axis adjustments and ±5° theta planarization
- Sample stage with in-plane translation and ±5° in-plane rotation
- Cables, shields, and guards minimize electrical noise and thermal radiation losses
- Options and accessories for customization to specific research needs
| | More information on the Model FWPX Cryogenic Probe Station |
| | Model EMPX-HF Cryogenic Probe Station |  | Features of the Model EMPX-HF Probe Station
- 5.5 kOe (0.55 T) horizontal (in-plane) field electromagnet
- 360° sample stage rotation option
- High stability operation from 3.2 K to 400 K
- Measurements from DC to 67 GHz
- Accommodates up to 25 mm (1 in) diameter wafers
- Configurable with up to four thermally anchored micro-manipulated probe arms
- Probe arms with 3-axis adjustments and ±5° theta planarization
- Cables, shields, and guards minimize electrical noise and thermal radiation losses
- Options and accessories for customization to specific research needs
| | More information on the Model EMPX-HF Cryogenic Probe Station |
| | Model CPX-HF Cryogenic Probe Station |  | Features of the Model CPX-HF Probe Station
- 10 kOe (1 T) horizontal field superconducting magnet
- High stability operation from 2 K to 400 K
- Sample can be maintained at room temperature while system cools, reducing potential for condensation
- Multiple radiation shields optimized to minimize cryogen consumption
- Sample stage with ±5° in-plane rotation
- Measurements from DC to 67 GHz
- Optional high vacuum to 10-7 torr
- Accommodates up to 25 mm (1 in) diameter wafers
- Configurable with up to four thermally anchored micro-manipulated probe arms
- Probe arms with 3-axis adjustments and ±5° theta planarization
- Cables, shields, and guards minimize electrical noise and thermal radiation losses
- Options and accessories for customization to specific research needs
| | More information on the Model CPX-HF Cryogenic Probe Station |
| | Model CPX-VF Cryogenic Probe Station |  | Features of the Model CPX-VF Probe Station
- 25 kOe (2.5 T) vertical field superconducting magnet
- High stability operation from 2 K to 400 K
- Sample can be maintained at room temperature while system cools, reducing potential for condensation
- Multiple radiation shields optimized to minimize cryogen consumption
- Sample stage with ±5° in-plane rotation
- Measurements from DC to 67 GHz
- Optional high vacuum to 10-7 torr
- Accommodates up to 51 mm (2 in) diameter wafers
- Configurable with up to six thermally anchored micro-manipulated probe arms
- Probe arms with 3-axis adjustments and ±5° theta planarization
- Cables, shields, and guards minimize electrical noise and thermal radiation losses
- Options and accessories for customization to specific research needs
| | More information on the Model CPX-VF Cryogenic Probe Station |
| | Model CPX Cryogenic Probe Station |  | Features of the Model CPX Probe Station
- High stability operation from 4.2 K to 475 K
- Optional temperature range from 1.6 K to 400 K or 20 K to 675 K
- Sample can be maintained at room temperature while system cools, reducing potential for condensation
- Multiple radiation shields optimized to minimize cryogen consumption
- Sample stage with ±5° in-plane rotation
- Measurements from DC to 67 GHz
- Optional high vacuum to 10-7 torr
- Optional load-lock assembly
- Accommodates up to 51 mm (2 in) diameter wafers
- Configurable with up to six thermally anchored micromanipulated probe arms
- Probe arms with 3-axis adjustments and ±5° theta planarization
- Cables, shields, and guards minimize electrical noise and thermal radiation losses
- Options and accessories for customization to specific research needs
| | More information on the Model CPX Cryogenic Probe Station |
| | Model TTPX Cryogenic Probe Station |  | Features of the Model TTPX Probe Station
- High stability operation from 4.2 K to 475 K
- Optional temperature range from 3.2 K to 475 K or 20 K to 675 K
- Ø5 mm (0.2 in) optical access through the sample stage for backside illumination of the sample
- Measurements from DC to 67 GHz
- Accommodates up to 51 mm (2 in) diameter wafers
- Configurable with up to six thermally anchored micro-manipulated probe arms
- Probe arms with 3-axis adjustments and ±5° theta planarization
- Cables, shields, and guards minimize electrical noise and thermal radiation losses
- Tabletop design with small footprint
- Options and accessories for customization to specific research needs
| | More information on the Model TTPX Cryogenic Probe Station |
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